SANTA CLARA, Calif. — Advantest Corp. today announced it has begun selling new DRAM and flash memory tester that has the ability to simultaneously test up to 128 devices at a time with speeds of 143 ...

T5773 and HA5100CELL are new solutions that accommodate high-capacity, high-speed, next-generation NAND flash memory devices from wafer test to volume production. The T5773 Test System provides ...

Teradyne Inc., a maker of electronic test equipment based in North Reading, reports it has agreed to spend $325 million to purchase San Jose-based Nextest Systems Corp. The acquisition would provide ...

TOKYO—Semiconductor test equipment supplier Advantest Corporation has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...